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4456: clarify setup for the tests

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occheung 2022-02-14 11:02:07 +08:00
parent 75f3a328db
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@ -371,10 +371,12 @@ Test results are from the Krzysztof Belewicz's thesis ``Microwave synthesizer fo
\newpage \newpage
Phase noise performance of Mirny was tested using an ADF4351 evaluation kit through a DIO-tester\repeatfootnote{mirny_thesis}. Phase noise performance of Mirny was tested using the ADF4351 evaluation kit\repeatfootnote{mirny_thesis}.
The SPI signal is driven by the evaluation kit, converted into LVDS signal by propagating through the DIO-tester card, finally arriving at the Mirny card.
Mirny is then connected to the RSA5100A spectrum analyzer for measurement. Mirny is then connected to the RSA5100A spectrum analyzer for measurement.
Noise response spike can be improved by inserting a common-mode choke between the power supply and Mirny. Noise response spike can be improved by inserting an additional common-mode choke between the power supply and Mirny.
Note that the common-mode choke is not present on the Mirny card.
The following is a comparison between 2 setups at 1 GHz output: The following is a comparison between 2 setups at 1 GHz output:
\begin{itemize} \begin{itemize}
\item Red: Before any modifications \item Red: Before any modifications