forked from sinara-hw/assembly
1.7 KiB
1.7 KiB
Sinara 2245 LVDS DIO card
JSON
Be aware of the reversed EEM order on the card:
[
{
"type": "dio",
"board": "DIO_LVDS",
"ports": [1],
"bank_direction_low": "input",
"bank_direction_high": "input",
"edge_counter": false // or true
},
{
"type": "dio",
"board": "DIO_LVDS",
"ports": [0],
"bank_direction_low": "output",
"bank_direction_high": "output"
}
]
Setup
Switch DIPs in required position per each channel individually. Each RJ45 have 4 channels.
Testing
*** Testing TTL inputs.
TTL device to use as stimulus (default: ttl0): ttl0
Connect ttl0 to ttl4. Press ENTER when done.
PASSED # <--------
Connect ttl0 to ttl5. Press ENTER when done.
FAILED
Connect ttl0 to ttl6. Press ENTER when done.
FAILED
Connect ttl0 to ttl7. Press ENTER when done.
FAILED
...
*** Testing TTL inputs.
TTL device to use as stimulus (default: ttl0): ttl1
Connect ttl1 to ttl4. Press ENTER when done.
FAILED
Connect ttl1 to ttl5. Press ENTER when done.
PASSED # <--------
Connect ttl1 to ttl6. Press ENTER when done.
FAILED
Connect ttl1 to ttl7. Press ENTER when done.
FAILED
...
- Connect a RJ45 output port to a input port
- Run
artiq_sinara_tester
- One TTL will pass while other will fail
- Run
artiq_sinara_tester
again and increment the stimulus (e.g.ttl0->ttl1->ttl2->ttl3
) until all channels on the input port passed at least once - Plug into to another input port and repeat 2-4 until all input ports are tested
It is incompatible with other TTL cards, so you will need to use same or other LVDS card for proper testing.