fix formatting:

master
Joe Britton 2019-03-05 11:53:35 -05:00
parent 20281434ca
commit 93e7303a24
1 changed files with 3 additions and 3 deletions

6
pp.md
View File

@ -80,7 +80,7 @@ The original SAWG was developed by M-Labs for Sayma v1.0. Here, "v1" refers to S
- 240 MHz is max RF out - 240 MHz is max RF out
- f1, f2: 150 MHz modulation, +/- 60 MHz anti-aliasing filter bandwidth - f1, f2: 150 MHz modulation, +/- 60 MHz anti-aliasing filter bandwidth
__SAWG v2.0 milestone_ __SAWG v2.0 milestone__
This is an extension of SAWG v1.0 with a 1 GSPS data rate. This milestone also includes board-board synchronization. This is an extension of SAWG v1.0 with a 1 GSPS data rate. This milestone also includes board-board synchronization.
- f_rtio = f_dac_ref = 125 MHz (same as for Kasli) - f_rtio = f_dac_ref = 125 MHz (same as for Kasli)
@ -333,7 +333,7 @@ Code submitted for inclusion in ARTIQ shall comply with CONTRIBUTING.rst (https:
- __O1.03__ participate in HT2 design review - __O1.03__ participate in HT2 design review
- __O1.04_ based on O1.01, ensure passage of ST3 for a pair of AD9154 DACs on a single Sayma v2 board in configuration TS1. Note that this test is short of the full ST3 test which specifies a pair of Sayma v2 boards. - __O1.04__ based on O1.01, ensure passage of ST3 for a pair of AD9154 DACs on a single Sayma v2 board in configuration TS1. Note that this test is short of the full ST3 test which specifies a pair of Sayma v2 boards.
- Write and document code. Generate pull request. - Write and document code. Generate pull request.
- __O1.05__ ADF4356 - __O1.05__ ADF4356
@ -404,7 +404,7 @@ Each MTk includes a short report and option to implement.
- __M2.03__ Review of the scheme for synchronization between pairs of Sayma boards and complete clocking scheme. - __M2.03__ Review of the scheme for synchronization between pairs of Sayma boards and complete clocking scheme.
- __ M2.04__ SDRAM test suite - __M2.04__ SDRAM test suite
In support of HT3 tests conducted by Hardware Developer, write In support of HT3 tests conducted by Hardware Developer, write
gateware module to test SDRAM power consumption and signal integrity. gateware module to test SDRAM power consumption and signal integrity.