4456: clarify setup for the tests
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4456.tex
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4456.tex
@ -371,10 +371,12 @@ Test results are from the Krzysztof Belewicz's thesis ``Microwave synthesizer fo
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\newpage
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Phase noise performance of Mirny was tested using an ADF4351 evaluation kit through a DIO-tester\repeatfootnote{mirny_thesis}.
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Phase noise performance of Mirny was tested using the ADF4351 evaluation kit\repeatfootnote{mirny_thesis}.
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The SPI signal is driven by the evaluation kit, converted into LVDS signal by propagating through the DIO-tester card, finally arriving at the Mirny card.
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Mirny is then connected to the RSA5100A spectrum analyzer for measurement.
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Noise response spike can be improved by inserting a common-mode choke between the power supply and Mirny.
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Noise response spike can be improved by inserting an additional common-mode choke between the power supply and Mirny.
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Note that the common-mode choke is not present on the Mirny card.
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The following is a comparison between 2 setups at 1 GHz output:
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\begin{itemize}
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\item Red: Before any modifications
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