79 lines
1.7 KiB
Markdown
79 lines
1.7 KiB
Markdown
# Sinara 2245 LVDS DIO card
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* [Wiki](https://github.com/sinara-hw/DIO_LVDS_RJ45/wiki)
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* [Datasheet](https://m-labs.hk/docs/sinara-datasheets/2245.pdf)
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## JSON
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Be aware of the reversed EEM order on the card:
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```json
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[
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{
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"type": "dio",
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"board": "DIO_LVDS",
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"ports": [1],
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"bank_direction_low": "input",
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"bank_direction_high": "input",
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"edge_counter": false // or true
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},
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{
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"type": "dio",
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"board": "DIO_LVDS",
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"ports": [0],
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"bank_direction_low": "output",
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"bank_direction_high": "output"
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}
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]
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```
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## Setup
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Switch DIPs in required position per each channel individually. Each RJ45 have 4 channels.
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![](../img/lvds_ttl_switches.jpg)
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## Testing
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```bash
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*** Testing TTL inputs.
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TTL device to use as stimulus (default: ttl0): ttl0
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Connect ttl0 to ttl4. Press ENTER when done.
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PASSED # <--------
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Connect ttl0 to ttl5. Press ENTER when done.
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FAILED
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Connect ttl0 to ttl6. Press ENTER when done.
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FAILED
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Connect ttl0 to ttl7. Press ENTER when done.
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FAILED
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...
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*** Testing TTL inputs.
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TTL device to use as stimulus (default: ttl0): ttl1
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Connect ttl1 to ttl4. Press ENTER when done.
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FAILED
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Connect ttl1 to ttl5. Press ENTER when done.
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PASSED # <--------
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Connect ttl1 to ttl6. Press ENTER when done.
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FAILED
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Connect ttl1 to ttl7. Press ENTER when done.
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FAILED
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...
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```
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1. Connect a RJ45 output port to a input port
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2. Run `artiq_sinara_tester`
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3. One TTL will pass while other will fail
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4. Run `artiq_sinara_tester` again and increment the stimulus (e.g. `ttl0->ttl1->ttl2->ttl3`) until all channels on the input port passed at least once
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5. Plug into to another input port and repeat 2-4 until all input ports are tested
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It is incompatible with other TTL cards, so you will need to use same or other LVDS card for proper testing. |