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4456: clarify setup for the tests

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occheung 2022-02-14 11:02:07 +08:00
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4456.tex
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@ -371,10 +371,12 @@ Test results are from the Krzysztof Belewicz's thesis ``Microwave synthesizer fo
\newpage
Phase noise performance of Mirny was tested using an ADF4351 evaluation kit through a DIO-tester\repeatfootnote{mirny_thesis}.
Phase noise performance of Mirny was tested using the ADF4351 evaluation kit\repeatfootnote{mirny_thesis}.
The SPI signal is driven by the evaluation kit, converted into LVDS signal by propagating through the DIO-tester card, finally arriving at the Mirny card.
Mirny is then connected to the RSA5100A spectrum analyzer for measurement.
Noise response spike can be improved by inserting a common-mode choke between the power supply and Mirny.
Noise response spike can be improved by inserting an additional common-mode choke between the power supply and Mirny.
Note that the common-mode choke is not present on the Mirny card.
The following is a comparison between 2 setups at 1 GHz output:
\begin{itemize}
\item Red: Before any modifications