1
0
Fork 0

Compare commits

...

2 Commits

Author SHA1 Message Date
morgan 9323039e6a lvds: add DIP switch jpg 2024-02-20 17:23:40 +08:00
morgan 0952e36a84 lvds: expand testing methodology 2024-02-20 17:23:17 +08:00
2 changed files with 44 additions and 3 deletions

View File

@ -31,8 +31,49 @@ Be aware of the reversed EEM order on the card:
Switch DIPs in required position per each channel individually. Each RJ45 have 4 channels.
![](../img/lvds_ttl_switches.jpg)
## Testing
You can test channels by connecting Ethernet RJ45 cable. Since the artiq_sinara_tester allows to choose only one DIO
port, you will need to run the test 4 times and choose different output source and track that every 4th is passing the test.
It is also incompatible with other TTL cards, so you will need to use same or other LVDS card for proper testing.
```bash
*** Testing TTL inputs.
TTL device to use as stimulus (default: ttl0): ttl0
Connect ttl0 to ttl4. Press ENTER when done.
PASSED # <--------
Connect ttl0 to ttl5. Press ENTER when done.
FAILED
Connect ttl0 to ttl6. Press ENTER when done.
FAILED
Connect ttl0 to ttl7. Press ENTER when done.
FAILED
...
*** Testing TTL inputs.
TTL device to use as stimulus (default: ttl0): ttl1
Connect ttl1 to ttl4. Press ENTER when done.
FAILED
Connect ttl1 to ttl5. Press ENTER when done.
PASSED # <--------
Connect ttl1 to ttl6. Press ENTER when done.
FAILED
Connect ttl1 to ttl7. Press ENTER when done.
FAILED
...
```
1. Connect a RJ45 output port to a input port
2. Run `artiq_sinara_tester`
3. One TTL will pass while other will fail
4. Run `artiq_sinara_tester` again and increment the stimulus (e.g. `ttl0->ttl1->ttl2->ttl3`) until all channels on the input port passed at least once
5. Plug into to another input port and repeat 2-4 until all input ports are tested
It is incompatible with other TTL cards, so you will need to use same or other LVDS card for proper testing.

Binary file not shown.

After

Width:  |  Height:  |  Size: 81 KiB