forked from sinara-hw/assembly
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Author | SHA1 | Date |
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morgan | 9323039e6a | |
morgan | 0952e36a84 |
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@ -31,8 +31,49 @@ Be aware of the reversed EEM order on the card:
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Switch DIPs in required position per each channel individually. Each RJ45 have 4 channels.
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![](../img/lvds_ttl_switches.jpg)
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## Testing
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You can test channels by connecting Ethernet RJ45 cable. Since the artiq_sinara_tester allows to choose only one DIO
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port, you will need to run the test 4 times and choose different output source and track that every 4th is passing the test.
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It is also incompatible with other TTL cards, so you will need to use same or other LVDS card for proper testing.
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```bash
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*** Testing TTL inputs.
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TTL device to use as stimulus (default: ttl0): ttl0
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Connect ttl0 to ttl4. Press ENTER when done.
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PASSED # <--------
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Connect ttl0 to ttl5. Press ENTER when done.
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FAILED
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Connect ttl0 to ttl6. Press ENTER when done.
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FAILED
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Connect ttl0 to ttl7. Press ENTER when done.
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FAILED
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...
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*** Testing TTL inputs.
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TTL device to use as stimulus (default: ttl0): ttl1
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Connect ttl1 to ttl4. Press ENTER when done.
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FAILED
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Connect ttl1 to ttl5. Press ENTER when done.
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PASSED # <--------
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Connect ttl1 to ttl6. Press ENTER when done.
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FAILED
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Connect ttl1 to ttl7. Press ENTER when done.
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FAILED
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...
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```
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1. Connect a RJ45 output port to a input port
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2. Run `artiq_sinara_tester`
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3. One TTL will pass while other will fail
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4. Run `artiq_sinara_tester` again and increment the stimulus (e.g. `ttl0->ttl1->ttl2->ttl3`) until all channels on the input port passed at least once
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5. Plug into to another input port and repeat 2-4 until all input ports are tested
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It is incompatible with other TTL cards, so you will need to use same or other LVDS card for proper testing.
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