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lvds: expand testing methodology

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morgan 2024-02-20 17:09:03 +08:00
parent 9929476733
commit 0952e36a84
1 changed files with 42 additions and 3 deletions
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src/hw/lvds_dio.md
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@ -33,6 +33,45 @@ Switch DIPs in required position per each channel individually. Each RJ45 have 4
## Testing ## Testing
You can test channels by connecting Ethernet RJ45 cable. Since the artiq_sinara_tester allows to choose only one DIO ```bash
port, you will need to run the test 4 times and choose different output source and track that every 4th is passing the test. *** Testing TTL inputs.
It is also incompatible with other TTL cards, so you will need to use same or other LVDS card for proper testing. TTL device to use as stimulus (default: ttl0): ttl0
Connect ttl0 to ttl4. Press ENTER when done.
PASSED # <--------
Connect ttl0 to ttl5. Press ENTER when done.
FAILED
Connect ttl0 to ttl6. Press ENTER when done.
FAILED
Connect ttl0 to ttl7. Press ENTER when done.
FAILED
...
*** Testing TTL inputs.
TTL device to use as stimulus (default: ttl0): ttl1
Connect ttl1 to ttl4. Press ENTER when done.
FAILED
Connect ttl1 to ttl5. Press ENTER when done.
PASSED # <--------
Connect ttl1 to ttl6. Press ENTER when done.
FAILED
Connect ttl1 to ttl7. Press ENTER when done.
FAILED
...
```
1. Connect a RJ45 output port to a input port
2. Run `artiq_sinara_tester`
3. One TTL will pass while other will fail
4. Run `artiq_sinara_tester` again and increment the stimulus (e.g. `ttl0->ttl1->ttl2->ttl3`) until all channels on the input port passed at least once
5. Plug into to another input port and repeat 2-4 until all input ports are tested
It is incompatible with other TTL cards, so you will need to use same or other LVDS card for proper testing.